This suite contains instrumentation used to identify unknown materials via elemental and chemical state identification. This suite contains x-ray photoelectron spectroscopy (XPS) and fourier transform infrared (FTIR) spectrometer systems. They can also determine amount of chemical components in a mixture. The XPS, Versaprobe 5000 from Physical Electronics is capable of micro and macro area XPS analysis with the new focused x-ray spot technology as well as depth profiling, chemical state imaging, x-ray induced electron imaging and angle resolved analysis. Our FTIR Nicolet 8700 from Thermo Scientific uses reflection, transmission and absorption of mid to near IR wavelength range to characterize polymers, surface coatings, ultra-thin coatings, films on metals, surface contaminants, powders, pastes, rubbers, biomaterials etc. Energy dispersive (EDS), wavelength dispersive (WDS), electron energy loss spectroscpy (EELS) can be performed in SUPRA 55, EVO 50 SEMs and JEM 2100F TEM.