The X-ray Analysis Suite contains systems for performing non-destructive, X-ray-based characterization and analysis, including X-ray Photoelectron Spectroscopy (XPS), X-ray Imaging and CT, and X-ray Diffraction (XRD). These techniques enable macro- and micro-scale structural, compositional, chemical, and crystallographic analysis, and are often used to characterize Li-ion batteries and battery materials, flip chip packages, bonded wafers, PCBs, semiconductor materials, ceramics, polymers, medical devices and structures, and much more.
The suite includes the following instrumentation:
