Anju Sharma received her PhD in physics from Delhi
University, India, and earned a master’s degree in materials science and
engineering from Lehigh University in Pennsylvania. She joined the Binghamton
University staff in 2007. Sharma has extensive experience and background in non-destructive
analysis using scanning acoustic microscopy (C-SAM), 2D X-ray imaging and 3D
Computer Tomography (CT); surface analytical techniques such as atomic force
microscopy (AFM), X-ray photoelectron spectroscopy (XPS), secondary electron
microscopy (SEM), ellipsometry, profilometry and FTIR spectroscopy ultra-high
vacuum scanning tunneling microscopy (UHV-STM). She has also performed device
fabrication using photolithography and e-beam lithography. Sharma, who has
published more than 40 technical papers in peer-reviewed journals and
conference proceedings, also has taught graduate and undergraduate courses in physics.
Anju Sharma
Senior Scientist
S3IP – Small Scale Systems Integration and Packaging
Background
