The Scienta Omicron HAXPES-Lab provides research-quality, HArd X-ray PhotoElectron Spectroscopy (HAXPES) using an
Excillum liquid gallium jet 9.2 keV hard X-ray source and Scienta Omicron EW4000 hemispherical
analyzer. A traditional Al Kα 1.5 keV soft X-ray source is also available for soft
X-ray Photoelecton Spectroscopy (XPS).
Our system comes equipped with charge neautralizers for measuring insulating samples, an Ar sputter system for sample cleaning or destructive sputter depth studies, sample heating and cooling capabilities (160 - 1100 K), sample biasing capabilities (3 contact), an attached sample preparation chamber, and a vacuum transport suitcase for loading air and/or mositure sensitive samples into the system.
